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Claude bcb3ab5dd8 [gpio_expander] Add interrupt pin support for efficient event-driven operation 
This commit adds interrupt-based GPIO expander support to eliminate continuous
polling and significantly reduce I2C/SPI traffic and CPU usage.

## Key Changes

### Core Infrastructure (gpio_expander/cached_gpio.h)
- Extended CachedGpioExpander base class with interrupt pin support
- Added setup_interrupt_pin() method to attach native GPIO interrupt handlers
- Implemented interrupt-driven cache management:
  - ISR sets flag and enables component loop when interrupt fires
  - process_interrupt_() reads chip-specific interrupt status registers
  - Cache remains valid between interrupts (no polling)
  - Component loop automatically disabled until next interrupt
- Added virtual read_interrupt_status_() for chip-specific implementations
- Maintains backward compatibility: interrupt_pin is optional, defaults to polling

### MCP23xxx Family Support
- MCP23x17 (16-pin): Added INTF/INTCAP register reading
- MCP23x08 (8-pin): Added INTF/INTCAP register reading
- Configured IOCON register for interrupt mirroring (INTA=INTB)
- Combined with existing open_drain_ints support
- Chips: MCP23017, MCP23008, MCP23S17, MCP23S08

### PI4IOE5V6408 Support
- Implemented interrupt status register (0x13) reading
- Reads input state register (0x0F) to capture values and clear interrupt
- Single 8-pin bank design

### Python Configuration
- Added CONF_INTERRUPT_PIN to component schemas
- Uses pins.internal_gpio_input_pin_schema for validation
- Optional configuration maintains full backward compatibility
- Example:
  ```yaml
  mcp23017:
    id: my_expander
    interrupt_pin: GPIO5  # Connect to INTA/INTB

  binary_sensor:
    - platform: gpio
      pin:
        mcp23xxx: my_expander
        number: 0
        interrupt: CHANGE  # Existing config, now uses hardware interrupt
  ```

### Testing
- Updated component test configurations
- Added interrupt_pin test cases for both MCP23017 and PI4IOE5V6408
- Tests both polling mode (no interrupt_pin) and interrupt mode

## Benefits

| Aspect         | Before (Polling) | After (Interrupts) |
|----------------|------------------|-------------------|
| I2C Reads      | 60-120/sec       | 2 per state change|
| CPU Usage      | Continuous loop  | ISR + event-driven|
| Latency        | ~16ms (loop)     | <1ms (ISR)        |
| Power          | Higher           | Lower (sleep)     |

## Implementation Details

**Interrupt Flow:**
1. Setup: Native GPIO interrupt attached to INTA/INTB pin (FALLING edge)
2. ISR: Sets pending flag, calls enable_loop_soon_any_context()
3. Loop: Reads interrupt status register to identify changed pins
4. Cache: Updates only changed pins, keeps cache valid
5. Optimization: Calls disable_loop() until next interrupt

**Safety:**
- Uses volatile bool for interrupt_pending_ flag
- IRAM_ATTR on ISR for fast execution
- Gracefully falls back to polling if interrupt_pin not configured
- No changes required to binary_sensor platform code

## Backward Compatibility

✅ Existing configurations work unchanged (polling mode)
✅ interrupt_pin is optional - add when ready
✅ No breaking changes to any APIs
✅ Binary sensors automatically benefit from interrupt efficiency

Addresses the need for efficient GPIO expander operation by eliminating
unnecessary continuous polling when hardware interrupts are available.
2025-11-17 21:45:47 +00:00
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a01nyub
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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a02yyuw
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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a4988
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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absolute_humidity
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ac_dimmer
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
adc
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
adc128s102
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
addressable_light
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
ade7880
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ade7953_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ade7953_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ads1115
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ags10
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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aht10
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
aic3204
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
airthings_wave_mini
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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airthings_wave_plus
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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alarm_control_panel
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
alpha3
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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am43
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
am2315c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
am2320
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
analog_threshold
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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animation
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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anova
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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apds9306
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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apds9960
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
api
Ensure event paths are enabled in api compile tests (#11776)
2025-11-10 14:28:49 +13:00
as3935_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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as3935_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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as5600
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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as7341
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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at581x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
atc_mithermometer
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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atm90e26
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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atm90e32
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
axs15231
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
b_parasite
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ballu
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
bang_bang
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bedjet
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
beken_spi_led_strip
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
bh1750
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bh1900nux
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
binary_sensor
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
binary_sensor_map
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bl0906
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bl0939
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bl0940
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bl0942
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ble_client
Add ble_client lambda compile tests (#11787)
2025-11-10 11:09:25 +13:00
ble_nus
[nrf52, ble_nus] add logging over BLE (#9846)
2025-10-19 07:41:19 -10:00
ble_presence
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ble_rssi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ble_scanner
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bluetooth_proxy
[esp32_ble] Add support for hosted BLE (#11167)
2025-10-15 15:19:08 -04:00
bme68x_bsec2_i2c
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
bme280_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bme280_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bme680
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bme680_bsec
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
bmi160
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bmp3xx_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bmp3xx_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bmp085
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bmp280_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bmp280_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bmp581
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bp1658cj
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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bp5758d
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
button
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
bytebuffer
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
camera
[ci] Merge components with different buses to reduce CI time (#11251)
2025-10-16 16:36:03 +13:00
camera_encoder
[ci] Merge components with different buses to reduce CI time (#11251)
2025-10-16 16:36:03 +13:00
canbus
Add additional compile time tests for canbus (#11789)
2025-11-10 11:09:46 +13:00
cap1188
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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captive_portal
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ccs811
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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cd74hc4067
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ch422g
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
chsc6x
[tests] Migrate components to shared packages and fix ID ambiguity (#11819)
2025-11-10 19:00:54 -06:00
climate
[climate] Add basic compile tests for climate component (#11404)
2025-10-20 03:27:04 +00:00
climate_ir_lg
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cm1106
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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color
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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color_temperature
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
combination
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
const
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
coolix
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
copy
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cs5460a
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cse7761
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cse7766
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cst226
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cst816
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ct_clamp
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
current_based
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
cwww
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dac7678
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
daikin
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
daikin_arc
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
daikin_brc
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dallas_temp
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
daly_bms
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
datetime
[datetime][ci][tests] Replace test.all.yaml with minimal platform cover (#11151)
2025-10-09 13:45:59 -10:00
debug
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
deep_sleep
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
delonghi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
demo
[demo] Clean up schema deprecations, add test (#8771)
2025-05-13 05:16:23 +00:00
dfplayer
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dfrobot_sen0395
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dht
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dht12
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
display
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
dps310
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ds1307
[nrf52,pcf8563] fix build error (#11846)
2025-11-11 17:50:07 +00:00
ds2484
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
dsmr
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
duty_cycle
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
duty_time
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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e131
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ee895
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ektf2232
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
emc2101
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
emmeti
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
endstop
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ens160_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ens160_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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ens210
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
epaper_spi
[epaper_spi] Refactoring (#11540)
2025-11-04 10:45:32 +13:00
es7210
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
es7243e
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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es8156
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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es8311
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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es8388
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
esp32
[esp32] Add sdkconfig flag to make OTA work for 32MB flash (#11883)
2025-11-13 10:52:08 -05:00
esp32_ble
[ci][tests] Remove all redundant ESP32-C3 Arduino tests (#11154)
2025-10-10 16:02:18 +13:00
esp32_ble_beacon
[esp32_ble_beacon, esp32_ble_tracker] Remove unused Arduino includes and redundant tests (#11140)
2025-10-09 11:42:25 -10:00
esp32_ble_client
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
esp32_ble_server
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
esp32_ble_tracker
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
esp32_camera
[ci] Merge components with different buses to reduce CI time (#11251)
2025-10-16 16:36:03 +13:00
esp32_camera_web_server
[ci] Merge components with different buses to reduce CI time (#11251)
2025-10-16 16:36:03 +13:00
esp32_can
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
esp32_dac
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
esp32_hosted
[esp32_hosted] Initial OTA implementation (#11562)
2025-11-03 14:08:50 -06:00
esp32_improv
[esp32_improv]: add next_url support for WiFi provisioning (#10757)
2025-10-20 19:10:38 +13:00
esp32_rmt_led_strip
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
esp32_touch
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
esp8266
[core] Add helper functions for clamp_at_... (#10387)
2025-11-06 15:48:02 +13:00
esp8266_pwm
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
esp_ldo
[esp_ldo] Component schema; default priority (#9479)
2025-07-13 23:47:52 +00:00
esphome
[core] Add support for setting environment variables (#11953)
2025-11-17 12:32:08 -05:00
espnow
[espnow] Add transport platform for packet_transport (#11025)
2025-10-20 10:44:20 -04:00
ethernet
[ethernet] Add RMII GPIO pin conflict validation (#11488)
2025-10-22 16:37:50 -10:00
ethernet_info
[ethernet] Add RMII GPIO pin conflict validation (#11488)
2025-10-22 16:37:50 -10:00
event
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
exposure_notifications
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
external_components
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ezo
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ezo_pmp
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
factory_reset
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
fan
[fan] Add basic fan compile tests (#11484)
2025-10-23 10:53:15 +13:00
fastled_clockless
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
fastled_spi
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
feedback
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
fingerprint_grow
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
font
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
fs3000
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ft5x06
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ft63x6
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
fujitsu_general
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gcja5
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gdk101
[gdk101] Fix fw version reporting (#11029)
2025-11-05 22:19:29 -05:00
gl_r01_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
globals
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gp2y1010au0f
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gp8403
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gpio
Add gpio switch interlock compile tests (#11449)
2025-10-22 10:12:32 +13:00
gps
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
graph
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
graphical_display_menu
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gree
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
grove_gas_mc_v2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
grove_tb6612fng
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
growatt_solar
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
gt911
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
haier
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
havells_solar
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hbridge
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hdc1080
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hdc2010
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
he60r
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
heatpumpir
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
hitachi_ac344
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hitachi_ac424
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hlk_fm22x
[tests] Migrate components to shared packages and fix ID ambiguity (#11819)
2025-11-10 19:00:54 -06:00
hlw8012
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hm3301
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hmc5883l
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
homeassistant
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
honeywell_hih_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
honeywellabp
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
honeywellabp2_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
host
[core] Add helper functions for clamp_at_... (#10387)
2025-11-06 15:48:02 +13:00
hrxl_maxsonar_wr
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hte501
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
http_request
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
htu21d
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
htu31d
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hx711
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hydreon_rgxx
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
hyt271
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
i2c_device
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
i2s_audio
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
iaqcore
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ili9xxx
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
image
[display] Optimize display writers with function pointers for stateless lambdas (#11629)
2025-11-05 11:14:54 +13:00
improv_base
[improv_serial] Various optimizations (#11473)
2025-10-23 14:24:08 +13:00
improv_serial
[ci][improv_serial][tests] Remove redundant ESP32 Arduino test files (#11138)
2025-10-09 19:17:04 +00:00
ina2xx_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ina2xx_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ina219
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ina226
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ina260
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ina3221
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
inkbird_ibsth1_mini
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
inkplate
[psram] Require mode for S3 (#11470)
2025-11-04 16:38:43 +13:00
integration
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
internal_temperature
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
interval
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
jsn_sr04t
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
json
[json] Fix component test compilation errors (#11647)
2025-11-01 11:18:10 -05:00
kamstrup_kmp
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
key_collector
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
kmeteriso
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
kuntze
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lc709203f
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lcd_gpio
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lcd_menu
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lcd_pcf8574
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ld2410
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ld2412
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ld2420
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ld2450
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ledc
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
libretiny
[core] Add helper functions for clamp_at_... (#10387)
2025-11-06 15:48:02 +13:00
light
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lightwaverf
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
lilygo_t5_47
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lm75b
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lock
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
logger
[ci][logger][tests] Remove redundant ESP32 Arduino test files (#11144)
2025-10-09 13:30:05 -10:00
lps22
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ltr390
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ltr501
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ltr_als_ps
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
lvgl
[lvgl] Migrate lv_font creation into Font class and optimise (#11915)
2025-11-17 08:47:54 +11:00
m5stack_8angle
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mapping
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
matrix_keypad
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
max6675
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max6956
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max7219
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max7219digit
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max9611
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max17043
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max31855
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max31856
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max31865
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
max44009
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp23s08
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp23s17
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp47a1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp2515
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp3008
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp3204
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp3221
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
mcp4461
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp4725
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp4728
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp9600
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp9808
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp23008
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp23016
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mcp23017
[gpio_expander] Add interrupt pin support for efficient event-driven operation
2025-11-17 21:45:47 +00:00
mdns
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
media_player
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
mhz19
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
micro_wake_word
[micro_wake_word] add new VPE features (#8655)
2025-05-01 12:22:48 +12:00
micronova
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
microphone
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mics_4514
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
midea
[tests] Migrate remote_transmitter/receiver to common bus definitions (#11325)
2025-10-17 17:21:38 -10:00
midea_ir
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mipi_dsi
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
mipi_rgb
[mipi_rgb] Fix pin conflicts introduced by shared SPI bus in #11134 (#11185)
2025-10-12 08:58:56 -04:00
mipi_spi
[psram] Require mode for S3 (#11470)
2025-11-04 16:38:43 +13:00
mitsubishi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mixer
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mlx90393
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
mlx90614
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mmc5603
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mmc5983
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
modbus
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
modbus_controller
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
monochromatic
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mopeka_ble
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mopeka_pro_check
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mopeka_std_check
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mpl3115a2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mpr121
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mpu6050
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mpu6886
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mqtt
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
mqtt_subscribe
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ms5611
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
msa3xx
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
my9231
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
nau7802
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
neopixelbus
[ci][tests] Remove all redundant ESP32-C3 Arduino tests (#11154)
2025-10-10 16:02:18 +13:00
network
[network, psram, speaker wifi] Use CORE.data to enable high performance networking (#11812)
2025-11-11 18:43:06 -06:00
nextion
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
noblex
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
npi19
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
nrf52
[nrf52] add settings for dcdc converter (#11841)
2025-11-12 20:06:20 -06:00
ntc
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
online_image
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
opentherm
[opentherm][ci][tests] Remove redundant ESP32 Arduino tests and simplify conditionals (#11149)
2025-10-09 23:38:34 +00:00
openthread
[openthread] add poll period for mtd devices (#11374)
2025-11-06 16:57:31 +13:00
openthread_info
Add OpenThread support on ESP-IDF (#7506)
2025-06-11 17:27:58 +12:00
opt3001
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ota
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
output
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
packages
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
packet_transport
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
partition
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
pca6416a
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pca9554
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pca9685
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pcd8544
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pcf8563
[nrf52,pcf8563] fix build error (#11846)
2025-11-11 17:50:07 +00:00
pcf8574
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pcf85063
[nrf52,pcf8563] fix build error (#11846)
2025-11-11 17:50:07 +00:00
pi4ioe5v6408
[gpio_expander] Add interrupt pin support for efficient event-driven operation
2025-11-17 21:45:47 +00:00
pid
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pipsolar
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pm1006
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pm2005
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pmsa003i
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pmsx003
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pmwcs3
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pn532_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pn532_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pn7150_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pn7160_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pn7160_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
power_supply
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
preferences
[preferences] Better handling of flash_write_interval (#8199)
2025-02-05 15:34:30 +13:00
prometheus
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
psram
[psram] Add option to disable ignore not found sdkconfig setting (#11411)
2025-11-07 14:22:50 +13:00
pulse_counter
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
pulse_meter
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pulse_width
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pvvx_mithermometer
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pylontech
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pzem004t
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pzemac
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
pzemdc
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
qmc5883l
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
qmp6988
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
qr_code
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
qspi_dbi
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
qwiic_pir
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
radon_eye_ble
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
radon_eye_rd200
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rc522_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rc522_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rdm6300
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
remote_receiver
[remote_base] add support for Dyson cool AM07 tower fan (#10163)
2025-10-27 22:49:16 -04:00
remote_transmitter
Add additional tests for remote_transmitter raw (#11801)
2025-11-10 11:17:14 +13:00
resampler
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
resistance
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
restart
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rf_bridge
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rgb
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rgbct
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rgbw
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rgbww
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rotary_encoder
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rp2040
[core] Add helper functions for clamp_at_... (#10387)
2025-11-06 15:48:02 +13:00
rp2040_pio_led_strip
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
rp2040_pwm
[CI] Introduce testing for IDF 5 (and other arbitrary framework versions) (#6802)
2024-06-17 16:32:11 -05:00
rpi_dpi_rgb
Consolidate test files where all tests are identical (#6690)
2024-05-08 07:33:37 +12:00
rtttl
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
runtime_stats
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
ruuvi_ble
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ruuvitag
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
rx8130
[nrf52,pcf8563] fix build error (#11846)
2025-11-11 17:50:07 +00:00
safe_mode
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
scd4x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
scd30
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
script
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sdl
[display] Optimize display writers with function pointers for stateless lambdas (#11629)
2025-11-05 11:14:54 +13:00
sdm_meter
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sdp3x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sds011
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
seeed_mr24hpc1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
seeed_mr60bha2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
seeed_mr60fda2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
selec_meter
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sen5x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sen0321
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sen21231
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
senseair
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sensor
Add additional sensor filter tests (#11438)
2025-10-20 20:39:21 -10:00
servo
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sfa30
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sgp4x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sgp30
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sha256
Add sha256 support (#10882)
2025-09-26 08:53:21 +12:00
shelly_dimmer
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
sht3xd
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sht4x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
shtcx
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
shutdown
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sigma_delta_output
[ci][tests] Remove redundant ESP32 Arduino test files (#11136)
2025-10-10 07:26:41 +13:00
sim800l
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
slow_pwm
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sm300d2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sm2135
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sm2235
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sm2335
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sm16716
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sml
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
smt100
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sn74hc165
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sn74hc595
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sntp
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
socket
[core][esp32_ble][socket] Add wake_loop_threadsafe() helper for background thread wakeups (#11681)
2025-11-04 08:13:37 +13:00
sonoff_d1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sound_level
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
speaker
[tests] Migrate components to shared packages and fix ID ambiguity (#11819)
2025-11-10 19:00:54 -06:00
speed
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
spi
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
spi_device
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
spi_led_strip
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sprinkler
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sps30
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1306_i2c
[nrf52,ssd1306_i2c] fix build error (#11847)
2025-11-11 18:18:17 +00:00
ssd1306_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1322_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1325_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1327_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1327_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1331_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ssd1351_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
st7567_i2c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
st7567_spi
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
st7701s
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
st7735
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
st7789v
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
st7920
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
statsD
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
status
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
status_led
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
stepper
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sts3x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sun
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
sun_gtil2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
switch
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
sx126x
Add additional sx126x lambda tests (#11791)
2025-11-10 11:10:31 +13:00
sx127x
Add additional sx127x lambda tests (#11793)
2025-11-10 11:11:31 +13:00
sx1509
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
syslog
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
t6615
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tc74
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tca9548a
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tca9555
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tcl112
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tcs34725
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tee501
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
teleinfo
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tem3200
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
template
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
text_sensor
Add basic text_sensor tests (#11424)
2025-10-21 15:26:41 +13:00
thermostat
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
time
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
time_based
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tinyusb
[tinyusb] New component (#11678)
2025-11-03 18:29:30 -06:00
tlc5947
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tlc5971
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tlc59208f
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tm1621
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tm1637
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tm1638
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tm1651
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tmp102
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tmp117
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tmp1075
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tof10120
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tormatic
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
toshiba
[tests] Migrate components to shared packages and fix ID ambiguity (#11819)
2025-11-10 19:00:54 -06:00
total_daily_energy
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tsl2561
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tsl2591
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tt21100
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ttp229_bsf
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ttp229_lsf
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tuya
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
tx20
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
uart
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
udp
Add additional udp lambda tests (#11795)
2025-11-10 11:16:09 +13:00
ufire_ec
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ufire_ise
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
uln2003
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
ultrasonic
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
update
Group component tests to reduce CI time (#11134)
2025-10-12 07:21:45 +13:00
uponor_smatrix
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
uptime
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
usb_host
[usb_host] Fix transfer slot exhaustion at high data rates and add configurable max_transfer_requests (#11174)
2025-10-13 08:04:30 +13:00
usb_uart
[usb_uart] Fixes for transfer queue allocation (#11548)
2025-11-04 10:23:45 +11:00
vbus
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
veml3235
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
veml7700
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
version
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
vl53l0x
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
voice_assistant
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wake_on_lan
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
waveshare_epaper
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
web_server
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
web_server_idf
Add basic tests for web_server_idf (#11659)
2025-11-02 08:18:17 -06:00
whirlpool
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
whynter
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wiegand
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wifi
[wifi] Conditionally compile manual_ip to save 24-72 bytes RAM (#11833)
2025-11-11 23:27:08 +00:00
wifi_info
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wifi_signal
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wireguard
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wk2132_i2c
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2132_spi
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2168_i2c
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2168_spi
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2204_i2c
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2204_spi
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2212_i2c
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wk2212_spi
[ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)
2025-11-12 16:44:19 +13:00
wl_134
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
wled
[ci][tests] Remove all redundant ESP32-C3 Arduino tests (#11154)
2025-10-10 16:02:18 +13:00
wts01
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
x9c
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xgzp68xx
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_ble
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_cgd1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_cgdk2
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_cgg1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_cgpr1
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_gcls002
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_hhccjcy01
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_hhccpot002
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_jqjcy01ym
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_lywsd02
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_lywsd02mmc
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_lywsd03mmc
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_lywsdcgq
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_mhoc303
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_mhoc401
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_miscale
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_mjyd02yla
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_mue4094rt
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_rtcgq02lm
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_wx08zm
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xiaomi_xmwsdj04mmc
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xl9535
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
xpt2046
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
yashima
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
zhlt01
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
zio_ultrasonic
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
zwave_proxy
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
zyaura
[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
2025-11-07 15:44:01 +13:00
.gitignore
C++ components unit test framework (#9284)
2025-10-21 22:21:22 +00:00
main.cpp
C++ components unit test framework (#9284)
2025-10-21 22:21:22 +00:00
README.md
C++ components unit test framework (#9284)
2025-10-21 22:21:22 +00:00

README.md

How to write C++ ESPHome unit tests

  1. Locate the folder with your component or create a new one with the same name as the component.
  2. Write the tests. You can add as many .cpp and .h files as you need to organize your tests.

IMPORTANT: wrap all your testing code in a unique namespace to avoid linker collisions when compiling testing binaries that combine many components. By convention, this unique namespace is esphome::component::testing (where "component" is the component under test), for example: esphome::uart::testing.

Running component unit tests

(from the repository root)

./script/cpp_unit_test.py component1 component2 ...

The above will compile and run the provided components and their tests.

To run all tests, you can invoke cpp_unit_test.py with the special --all flag:

./script/cpp_unit_test.py --all

To run a specific test suite, you can provide a Google Test filter:

GTEST_FILTER='UART*' ./script/cpp_unit_test.py uart modbus

The process will return 0 for success or nonzero for failure. In case of failure, the errors will be printed out to the console.

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