J. Nick Koston a1ab19d127 [ci] Reduce release time by removing 21 redundant ESP32-S3 IDF tests (#11850)

2025-11-12 21:56:11 -05:00

..

common.h

…

test-uart_max_with_usb_cdc.esp32-s2-idf.yaml

…

test-uart_max_with_usb_serial_jtag.esp32-c3-idf.yaml

…

test.esp32-c3-idf.yaml

…

test.esp32-idf.yaml

Expand uart.write tests (#11785)

2025-11-10 11:09:03 +13:00

test.esp8266-ard.yaml

…

test.host.yaml

…

test.rp2040-ard.yaml

…

uart_component.cpp

…

uart_device.cpp

…