Group component tests to reduce CI time (#11134)
This commit is contained in:
@@ -1,10 +1,6 @@
|
||||
i2c:
|
||||
- id: i2c_sfa30
|
||||
scl: ${scl_pin}
|
||||
sda: ${sda_pin}
|
||||
|
||||
sensor:
|
||||
- platform: sfa30
|
||||
i2c_id: i2c_bus
|
||||
formaldehyde:
|
||||
name: SFA30 formaldehyde
|
||||
temperature:
|
||||
|
||||
Reference in New Issue
Block a user