[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
This commit is contained in:
@@ -1,7 +0,0 @@
|
||||
substitutions:
|
||||
cs_pin: GPIO6
|
||||
data_pin: GPIO7
|
||||
read_pin: GPIO2
|
||||
write_pin: GPIO3
|
||||
|
||||
<<: !include common.yaml
|
||||
Reference in New Issue
Block a user