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[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)
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@@ -1,7 +0,0 @@
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substitutions:
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i2s_bclk_pin: GPIO6
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i2s_lrclk_pin: GPIO7
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i2s_mclk_pin: GPIO8
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i2s_din_pin: GPIO3
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<<: !include common.yaml
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