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[ci] Reduce release time by removing 468 redundant ESP32-C3 IDF tests (#11737)

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This commit is contained in:
J. Nick Koston
2025-11-06 20:44:01 -06:00
committed by GitHub
parent 5d20e3a3b4
commit d0b399d771
467 changed files with 0 additions and 2212 deletions
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9
tests/components/lcd_gpio/test.esp32-c3-idf.yaml
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@@ -1,9 +0,0 @@
substitutions:
d0_pin: GPIO1
d1_pin: GPIO2
d2_pin: GPIO3
d3_pin: GPIO4
enable_pin: GPIO5
rs_pin: GPIO6
<<: !include common.yaml